Test, Measurement & Analytics

Top Stories

Challenges In Using Sub-7nm ICs In Automotive

Targeted design for test, better fault models, and in-system testing must keep pace with advanced-node components.

High-Quality Data Needed To Better Utilize Fab Data Streams

Engineers require timely and aligned data with just the right level of granularity.

Identifying Sources Of Silent Data Corruption

Rooting out the causes of silent data corruption errors will require testing improvements and much more.

E-Beam Inspection Proves Essential For Advanced Nodes

Throughput remains an issue. A solution will require a combination of technologies.

Who Is Most Likely To Link Financial And Manufacturing Data?

Who is most affected by linking of financial data and why.

Need For Speed Drives Targeted Testing

Predictive modeling, strategic sampling and embedded monitors help accelerate testing for yield limiting defects.

Secure Handling Of Financial Data In Manufacturing

Data sharing becomes more challenging when AI and multi-die assemblies are involved.

Why Thin Film Measurements Matter

Controlling film thickness to precise specifications is essential for ensuring high yield in high-performance devices.

Nearly Invisible: Defect Detection Below 5nm

Increasing complexity of semiconductor devices necessitates a fundamental rethinking of defect detection methodologies.

Hunting For Macro Defects

Detecting macro-defects on wafers and tracing them to their root cause is getting easier due to tool improvements and traceability advancements.

More Top Stories »



Round Tables

Who Is Most Likely To Link Financial And Manufacturing Data?

Who is most affected by linking of financial data and why.

Secure Handling Of Financial Data In Manufacturing

Data sharing becomes more challenging when AI and multi-die assemblies are involved.

Chip Failures: Prevention And Responses Over Time

How to identify the causes of failures before they happen, and how latent defects and rising complexity can impact reliability and security after y...

Optimizing DFT With AI And BiST

AI-driven automation, tighter design-test collaboration, and evolving BiST techniques are redefining DFT strategies.

DFT At The Leading Edge

Rising complexity and heterogeneous integration are reshaping test methodologies and fault coverage, but challenges persist.

More Roundtables »



Multimedia

Problems In Testing AI Chips

Reliability depends on consistency in contacts and clean signals.

What’s Changing In Outlier Detection

Augmenting testing metrics to improve reliability.

Using AI In Semiconductor Inspection

Finding anomalies and defects faster in complex chip and package topographies.

Speeding Up Acoustic Wafer Inspection

Why rotational scanning shrinks inspection time in complex chips and packages.

Real-Time Safety Monitoring

How do you know when a safety-critical chip is working properly?

More Multimedia »



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